Sample trapped charge induced signals in tapping-mode atom ic force microscopy
نویسندگان
چکیده
منابع مشابه
Tapping mode atomic force microscopy in liquid
We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFhif in liquid. Acoustic modes in the liquid excite the canti1eve.r. On soft samples, e.g., biolog...
متن کاملHarnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever...
متن کاملForce reconstruction from tapping mode force microscopy experiments.
Fast, accurate, and robust nanomechanical measurements are intensely studied in materials science, applied physics, and molecular biology. Amplitude modulation force microscopy (tapping mode) is the most established nanoscale characterization technique of surfaces for air and liquid environments. However, its quantitative capabilities lag behind its high spatial resolution and robustness. We de...
متن کاملInverting amplitude and phase to reconstruct tip-sample interaction forces in tapping mode atomic force microscopy.
Quantifying the tip-sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging, manipulation and spectroscopy using the AFM. In this paper we present a general theory for the reconstruction of tip-sample interaction forces using integral equations for AM-AFM and Chebyshev polynomial expansions. This allows us to ...
متن کاملPhase imaging and stiffness in tapping-mode atomic force microscopy
The dependence of phase angles in tapping-mode atomic force microscopy on the magnitude of tip-sample repulsive interactions was investigated, and phase images of several hard and soft samples were recorded as a function of the free amplitude Ao and the set-point tapping amplitude Asp. The phase angle of probe oscillation increases with decreasing the set-point amplitude ratio Asp/Ao. Phase ima...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of physics
سال: 2021
ISSN: ['0022-3700', '1747-3721', '0368-3508', '1747-3713']
DOI: https://doi.org/10.1088/1742-6596/2011/1/012092